Enhanced reliability of phase-change memory via modulation of local structure and chemical bonding by incorporating carbon in Ge$_2$Sb$_2$Te$_5$
Jeong Hwa Han, Hun Jeong, Hanjin Park, Hoedon Kwon, Dasol Kim, Donghyeok Lim, Seung Jae Baik, Young-Kyun Kwon and Mann-Ho Cho, RSC Adv.
11
, 22479-22488 (2021).
link:
download: